Technical Notes:

Nanotec Electronica supplies these Technical Notes to provide further support and information concerning our equipment, software and unique scanning techniques.

TN #1 - Block Diagrams
Presents block diagrams of the Nanotec systems, including the electronic block diagram, the HV unit and the Dynamic box with and without phase loop.

TN #2 - Lithography
Intended as a support document this details the Lithography Section of the WSxM Program. It describes each one of the menus that appear in the Lithography Section.

TN #3 - Jumping Modes in Liquids
Paper preprint from F. Moreno-Herrero, P. J. de Pablo, R. Fernández-Sánchez, J. Colchero, J. Gómez-Herrero and A. M. Baró.
Theoretical considerations on the performance of Scanning Force Microscopy Jumping Mode and Dynamic Mode are discussed.

TN #4 - Assembly & Connections [*.exe]
This self-extracting *.exe file will provide details assembly and connections of the entire SPM system.

TN #5 - NanoManipulator & WSxM
Details the simple interface between the WSxM software and the NanoManipulator Haptic interface.

TN #6 - Non-Linear Correction
Outlines the use of Non-linear correction within WSxM. Demonstrates how to reduce non-linear effects.

TN #7 - 3D Scanning Modes
Paper preprint from C. Gómez Navarro, A. Gil, M. Álvarez, P. J. De Pablo, F. Moreno-Herrero, I. Horcas, R. Fernández-Sánchez, J. Colchero, J. Gómez-Herrero and A. M. Baró. Different examples of 3D Scanning Modes are presented as working modes for Scanning Probe Microscopes, which generalizes the traditional method of acquiring data.

TN #8 - Function Generator
This powerful tool's use within the WSxM program is described. Primarily the Function Generator is used generate simple theoretic images and implement custom filters or processes among other uses. View PDF of examples of usage or visit webpage directly.

TN #9 - Altering C31 Base Address
Explanation on how to modify the base address that the C31 DSP board will use for data acquisition.

TN #10 - Using Closed Loop Scanner
Details the use of a closed loop scanner to reduce the non-linear behaviour of scanners.

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